Selection and prioritization of test cases by combining white-box and black-box testing methods

Abstract

In this paper, we present a methodology that combines both white-box and black-box testing, in order to improve testing quality for a given class of embedded systems. The goal of this methodology is generation of test cases for the new functional testing campaign based on the test coverage information from the previous testing campaign, in order to maximize the test coverage. Test coverage information is used for selection of proper test cases in order to improve the quality of testing and save available resources for testing. As an output, a set of test cases is produced. Generated test cases are processed by the test Executor application that decides whether results have passed or failed, based on the results of image grabbing, OCR text extraction, and comparison with expected text. The presented methodology is finally validated by means of a case-study targeting an Android device. The results of the case study are affirmative and they indicate that the proposed methodology is applicable for testing embedded systems of this kind. © 2013 IEEE.