Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/4857
Title: Correlation between the microstructure and electrical properties of Bi–As<inf>2</inf>S<inf>3</inf> quasibinar chalcogenides by using AC impedance spectroscopy
Authors: Šiljegović, Mirjana 
Sekulić, Dalibor
Lukić-Petrović, Svetlana 
Petrović, Đorđe
Issue Date: 1-Feb-2016
Journal: Journal of Materials Science: Materials in Electronics
Abstract: © 2015, Springer Science+Business Media New York. The objective of this paper was to study the AC impedance of Bi5(As2S3)95 and Bi7(As2S3)93 chalcogenides in a frequency range of 100 Hz to 1 MHz at different temperatures. A preliminary structural analysis of the compounds by X-ray diffraction technique and scanning electron microscope confirmed the amorphous character for the sample with x = 5 at.% Bi and the existence of two phases (amorphous + crystalline) for the sample with x = 7 at.%. Therefore, the AC impedance analysis by means of an equivalent circuit model was used to establish correlation between the distinct microstructures and electrical properties of these compounds. The presence of the glassy matrix and matrix–crystal interface effects was observed in the sample Bi7(As2S3)93. Moreover, the analysis of impedance data indicated the decrease of resistance with temperature for both samples usually shown by semiconductors i.e. negative temperature coefficient of resistance. The present Bi–As2S3 quasibinar chalcogenides also exhibit the temperature dependent relaxation phenomena. According to estimated values of activation energy of relaxation processes, it was concluded that the mechanisms of conductivity and relaxation are the same in both samples.
URI: https://open.uns.ac.rs/handle/123456789/4857
ISSN: 09574522
DOI: 10.1007/s10854-015-3937-8
Appears in Collections:PMF Publikacije/Publications

Show full item record

SCOPUSTM   
Citations

11
checked on May 3, 2024

Page view(s)

14
Last Week
3
Last month
0
checked on May 3, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.