Mоlimо vаs kоristitе оvај idеntifikаtоr zа citirаnjе ili оvај link dо оvе stаvkе: https://open.uns.ac.rs/handle/123456789/4857
Pоljе DC-аVrеdnоstЈеzik
dc.contributor.authorŠiljegović, Mirjanaen
dc.contributor.authorSekulić, Daliboren
dc.contributor.authorLukić-Petrović, Svetlanaen
dc.contributor.authorPetrović, Đorđeen
dc.date.accessioned2019-09-30T08:42:45Z-
dc.date.available2019-09-30T08:42:45Z-
dc.date.issued2016-02-01en
dc.identifier.issn09574522en
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/4857-
dc.description.abstract© 2015, Springer Science+Business Media New York. The objective of this paper was to study the AC impedance of Bi5(As2S3)95 and Bi7(As2S3)93 chalcogenides in a frequency range of 100 Hz to 1 MHz at different temperatures. A preliminary structural analysis of the compounds by X-ray diffraction technique and scanning electron microscope confirmed the amorphous character for the sample with x = 5 at.% Bi and the existence of two phases (amorphous + crystalline) for the sample with x = 7 at.%. Therefore, the AC impedance analysis by means of an equivalent circuit model was used to establish correlation between the distinct microstructures and electrical properties of these compounds. The presence of the glassy matrix and matrix–crystal interface effects was observed in the sample Bi7(As2S3)93. Moreover, the analysis of impedance data indicated the decrease of resistance with temperature for both samples usually shown by semiconductors i.e. negative temperature coefficient of resistance. The present Bi–As2S3 quasibinar chalcogenides also exhibit the temperature dependent relaxation phenomena. According to estimated values of activation energy of relaxation processes, it was concluded that the mechanisms of conductivity and relaxation are the same in both samples.en
dc.relation.ispartofJournal of Materials Science: Materials in Electronicsen
dc.titleCorrelation between the microstructure and electrical properties of Bi–As<inf>2</inf>S<inf>3</inf> quasibinar chalcogenides by using AC impedance spectroscopyen
dc.typeJournal/Magazine Articleen
dc.identifier.doi10.1007/s10854-015-3937-8en
dc.identifier.scopus2-s2.0-84956608309en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84956608309en
dc.relation.lastpage1661en
dc.relation.firstpage1655en
dc.relation.issue2en
dc.relation.volume27en
item.fulltextNo Fulltext-
item.grantfulltextnone-
crisitem.author.deptDepartman za fiziku-
crisitem.author.deptDepartman za fiziku-
crisitem.author.orcid0000-0003-2934-4432-
crisitem.author.orcid0000-0003-3166-0418-
crisitem.author.parentorgPrirodno-matematički fakultet-
crisitem.author.parentorgPrirodno-matematički fakultet-
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