Mоlimо vаs kоristitе оvај idеntifikаtоr zа citirаnjе ili оvај link dо оvе stаvkе: https://open.uns.ac.rs/handle/123456789/18097
Nаziv: Ellipsometric Characterization of Ag-As-S-Se Chalcogenide Thin Films
Аutоri: Čajko Kristina 
Lukić-Petrović Svetlana 
Wagner T
Prikryl Jan
Petrović Dragoslav
Dаtum izdаvаnjа: 2017
Čаsоpis: NANOENERGY 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications Abstract Book, 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications, NANOENERGY 2017, Helsinki, Finland, 2017, 26-28 July
URI: https://open.uns.ac.rs/handle/123456789/18097
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