Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/18097
Title: Ellipsometric Characterization of Ag-As-S-Se Chalcogenide Thin Films
Authors: Čajko Kristina 
Lukić-Petrović Svetlana 
Wagner T
Prikryl Jan
Petrović Dragoslav
Issue Date: 2017
Journal: NANOENERGY 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications Abstract Book, 4th International Conference on Nanotechnology, Nanomaterials and Thin Films for Energy Applications, NANOENERGY 2017, Helsinki, Finland, 2017, 26-28 July
URI: https://open.uns.ac.rs/handle/123456789/18097
Appears in Collections:PMF Publikacije/Publications

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