Молимо вас користите овај идентификатор за цитирање или овај линк до ове ставке:
https://open.uns.ac.rs/handle/123456789/15787
Назив: | X-ray diffraction study of Cu <inf>25</inf> [AsSe <inf>1.4</inf> I <inf>0.2</inf> ] <inf>75</inf> amorphous semiconductor | Аутори: | Bordás A. Vučinić M. Kapor A. Antić, Boris |
Датум издавања: | 1-јан-2001 | Часопис: | Materials Science Forum | Сажетак: | Many properties of chalcogenide amorphous semiconductors, such as electric conductivity, optical constants etc. depend on the type of the structural unit in the amorphous structure i.e. distribution of the nearest neighbor atoms. Obviously the identification of the type of the structural units is of great importance. Cu 25 [AsSe 1.4 I 0.2 ] 75 amorphous system and its crystalline phase prepared by slow cooling of the melt were analyzed on automatic X-ray diffractometer equipment. Using X-ray diffraction data we obtained the structure factor (SF). The reduced radial distribution function (RDF) was obtained in two ways: using standard method, Fourier transformation of SF, and maximum-entropy method. RDF analysis results are in agreement with model calculation, which proves the domination of tetrahedral structural units. | URI: | https://open.uns.ac.rs/handle/123456789/15787 | ISSN: | 2555476 |
Налази се у колекцијама: | FTN Publikacije/Publications |
Приказати целокупан запис ставки
Преглед/и станица
40
Протекла недеља
0
0
Протекли месец
0
0
проверено 10.05.2024.
Google ScholarTM
Проверите
Ставке на DSpace-у су заштићене ауторским правима, са свим правима задржаним, осим ако није другачије назначено.