Parameters extraction of ferrite EMI suppressors for PCB applications using microstrip test fixture

Abstract

The goal of this work was to investigate the behavior of a ferrite electromagnetic interference (EMI) suppressor when placed in a real surrounding. Electrical parameter measurements of the same EMI suppressor can differ for different combination of instruments and test fixtures. For that reason specially designed microstrip test fixtures are developed for the vector network analyzer (VNA) measurements. This paper describes the measurement technique, parameters extraction, and characterization of ferrite EMI suppressors for printed circuit board (PCB) applications. Two commercially available components, multilayer chip SMD inductors in a ferrite body, are measured and characterized using a VNA E5071B and developed adaptation test fixture on PCB board. These measurements describe intrinsic and extrinsic parameters of the components and their behavior. If the components are mounted on the PCB, i.e., in a real environment, then the two-port EMI suppressor model with extrinsic parameters has to be used at RF frequencies. The comparison of measured and datasheet values is further presented. © 2006 IEEE.