Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/8170
DC FieldValueLanguage
dc.contributor.authorPanić, Markoen
dc.contributor.authorĆulibrk, Dubravkoen
dc.contributor.authorSladojević, Srđanen
dc.contributor.authorCrnojević, Vladimiren
dc.date.accessioned2019-09-30T09:07:01Z-
dc.date.available2019-09-30T09:07:01Z-
dc.date.issued2013-01-01en
dc.identifier.isbn9783642410123en
dc.identifier.issn18650929en
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/8170-
dc.description.abstractIn the modern world, where multimedia is predicted to form 86% of traffic transmitted over the telecommunication networks in the near future, content providers are looking to shift towards Quality of Experience, rather than Quality of Service in multimedia delivery. Thus, no-reference image quality assessment and the related video quality assessment remaining open research problem, with significant market potential. In this paper we describe a study focused on evaluating the applicability of Local Binary Patterns (LBP) as features and neural networks as estimators for image quality assessment. We focus on blockiness artifacts, as a prominent effect in all block-based coding approaches and the dominant artifact in occurring in videos coded with state-of-the-art video codecs (MPEG-4, H.264, HVEC). In this initial study we show how an LBP-inspired approach, tuned to this particular effect, can be efficiently used to predict the MOS of JPEG coded images. The proposed approach is evaluated on a well-known public database and against widely-used features. The results presented in the paper show that the approach achieves superior performance, which forms a sound basis for future research aimed at video quality assessment and precise blocking artifact detection with sub-frame precision. © Springer-Verlag Berlin Heidelberg 2013.en
dc.relation.ispartofCommunications in Computer and Information Scienceen
dc.titleLocal Binary Patterns and Neural Networks for No-Reference Image and Video Quality Assessmenten
dc.typeConference Paperen
dc.identifier.doi10.1007/978-3-642-41013-0_40en
dc.identifier.scopus2-s2.0-84904601047en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84904601047en
dc.relation.lastpage395en
dc.relation.firstpage388en
dc.relation.issuePART 1en
dc.relation.volume383 CCISen
item.grantfulltextnone-
item.fulltextNo Fulltext-
crisitem.author.deptDepartman za industrijsko inženjerstvo i menadžment-
crisitem.author.deptDepartman za industrijsko inženjerstvo i menadžment-
crisitem.author.parentorgFakultet tehničkih nauka-
crisitem.author.parentorgFakultet tehničkih nauka-
Appears in Collections:FTN Publikacije/Publications
Show simple item record

SCOPUSTM   
Citations

1
checked on May 10, 2024

Page view(s)

39
Last Week
16
Last month
0
checked on May 10, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.