Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/5927
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dc.contributor.authorRadisavljević I.en_US
dc.contributor.authorNovaković, Nikolaen_US
dc.contributor.authorMahnke H.en_US
dc.contributor.authorRomčević N.en_US
dc.contributor.authorSlankamenac M.en_US
dc.contributor.authorSekulić, Daliboren_US
dc.contributor.authorIvanović N.en_US
dc.date.accessioned2019-09-30T08:51:17Z-
dc.date.available2019-09-30T08:51:17Z-
dc.date.issued2015-12-01-
dc.identifier.issn09574522en_US
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/5927-
dc.description.abstract© 2015, Springer Science+Business Media New York. Structural aspects of Cr and Ni incorporation into the PbTe lattice are studied by means of Extended X-ray Absorption Fine Structure (EXAFS). EXAFS measurements enabled to get exact information on Pb and Te local structural features and their thermal evolution. The obtained results also revealed that by distorting their local environment, impurity atoms (Cr, Ni) add to high inherent disorder already present in the host PbTe. Larger anharmonicity of the Pb–Te bond and larger atomic thermal parameters observed in PbTe(Cr, Ni) could be of interest for thermoelectronics applications since they are both expected to reduce the thermal conductivity.en
dc.relation.ispartofJournal of Materials Science: Materials in Electronicsen
dc.titleInfluence on Cr and Ni doping on PbTe local structural propertiesen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.doi10.1007/s10854-015-3682-z-
dc.identifier.scopus2-s2.0-84948090866-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84948090866-
dc.description.versionUnknownen_US
dc.relation.lastpage10026en
dc.relation.firstpage10020en
dc.relation.issue12en
dc.relation.volume26en
item.fulltextNo Fulltext-
item.grantfulltextnone-
crisitem.author.deptDepartman za energetiku, elektroniku i telekomunikacije-
crisitem.author.parentorgFakultet tehničkih nauka-
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