Please use this identifier to cite or link to this item:
https://open.uns.ac.rs/handle/123456789/19983| Title: | Measurement of Stark Halfwidths of Spectral Lines of Ionized Oxygen and Silicon Emitted from T-tube Plasma | Authors: | Gavanski Lazar | Issue Date: | 2019 | Journal: | Atoms | URI: | https://open.uns.ac.rs/handle/123456789/19983 | ISSN: | 2218-2004 |
| Appears in Collections: | PMF Publikacije/Publications |
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