Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/15793
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dc.contributor.authorDesnica V.en
dc.contributor.authorŽivanov L.en
dc.contributor.authorNimrihter M.en
dc.contributor.authorAleksić O.en
dc.contributor.authorLuković M.en
dc.date.accessioned2020-03-03T15:01:21Z-
dc.date.available2020-03-03T15:01:21Z-
dc.date.issued2001-01-01en
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/15793-
dc.description.abstractThe paper describes the design, fabrication and test of integrated LC filters in thick film technology. The range of filters was electrically characterized using a HP 8566B network analyzer. We present a scalable analytical model for thick film integrated LC filters that is suitable for design and circuit simulations. We also provide simple expressions for evaluating the optimum conductor thicknesses.en
dc.relation.ispartofConference Record - IEEE Instrumentation and Measurement Technology Conferenceen
dc.titleA comparative characteristics of thick film integrated LC filtersen
dc.typeConference Paperen
dc.identifier.scopus2-s2.0-0034838145en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/0034838145en
dc.relation.lastpage1020en
dc.relation.firstpage1016en
dc.relation.volume2en
item.grantfulltextnone-
item.fulltextNo Fulltext-
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