Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/13155
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dc.contributor.authorBlaž, Neluen_US
dc.contributor.authorRadosavljević, Goranen_US
dc.contributor.authorŽivanov, Ljiljanaen_US
dc.contributor.authorSmetana W.en_US
dc.date.accessioned2020-03-03T14:51:16Z-
dc.date.available2020-03-03T14:51:16Z-
dc.date.issued2009-12-01-
dc.identifier.isbn9781424444137en_US
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/13155-
dc.description.abstractIn this paper is presented the characterisation of dielectric LTCC tapes with capacitance method in frequency range between 100 Hz and 40 MHz. Also, the fabrication of LTCC samples is shown. The measuring of complex permittivity is managed based on accomplished formulas, and obtained results are explained in detail. For computer control measurement, a user-friendly program has been developed. In order to verify proposed method, obtained the results of LTCC tapes measurements samples are compared with catalogue characteristics. © 2009 IEEE.en
dc.relation.ispartofProceedings of the International Semiconductor Conference, CASen
dc.titleCharacterisation of dielectric LTCC tapes using the capacitance methoden_US
dc.typeConference Paperen_US
dc.identifier.doi10.1109/SMICND.2009.5336682-
dc.identifier.scopus2-s2.0-77950157528-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/77950157528-
dc.description.versionUnknownen_US
dc.relation.lastpage450en
dc.relation.firstpage447en
dc.relation.volume2en
item.grantfulltextnone-
item.fulltextNo Fulltext-
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