Please use this identifier to cite or link to this item:
https://open.uns.ac.rs/handle/123456789/10932
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Desnica V. | en |
dc.contributor.author | Živanov L. | en |
dc.contributor.author | Aleksić O. | en |
dc.contributor.author | Luković M. | en |
dc.contributor.author | Nimrihter M. | en |
dc.date.accessioned | 2020-03-03T14:42:01Z | - |
dc.date.available | 2020-03-03T14:42:01Z | - |
dc.date.issued | 2002-01-01 | en |
dc.identifier.issn | 00189456 | en |
dc.identifier.uri | https://open.uns.ac.rs/handle/123456789/10932 | - |
dc.description.abstract | The paper describes the design, fabrication, and test of integrated LC filters in thick-film technology. The range of filters was electrically characterized using the HP 8566B network analyzer. We present a scalable analytical model for thick-film integrated LC filters that is suitable for design and circuit simulations. We also provide simple expressions for evaluating the optimum conductor thicknesses. | en |
dc.relation.ispartof | IEEE Transactions on Instrumentation and Measurement | en |
dc.title | Comparative characteristics of thick-film integrated LC filters | en |
dc.type | Journal/Magazine Article | en |
dc.identifier.doi | 10.1109/TIM.2002.802238 | en |
dc.identifier.scopus | 2-s2.0-0036703437 | en |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/0036703437 | en |
dc.relation.lastpage | 576 | en |
dc.relation.firstpage | 570 | en |
dc.relation.issue | 4 | en |
dc.relation.volume | 51 | en |
item.grantfulltext | none | - |
item.fulltext | No Fulltext | - |
Appears in Collections: | FTN Publikacije/Publications |
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