Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/10932
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dc.contributor.authorDesnica V.en
dc.contributor.authorŽivanov L.en
dc.contributor.authorAleksić O.en
dc.contributor.authorLuković M.en
dc.contributor.authorNimrihter M.en
dc.date.accessioned2020-03-03T14:42:01Z-
dc.date.available2020-03-03T14:42:01Z-
dc.date.issued2002-01-01en
dc.identifier.issn00189456en
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/10932-
dc.description.abstractThe paper describes the design, fabrication, and test of integrated LC filters in thick-film technology. The range of filters was electrically characterized using the HP 8566B network analyzer. We present a scalable analytical model for thick-film integrated LC filters that is suitable for design and circuit simulations. We also provide simple expressions for evaluating the optimum conductor thicknesses.en
dc.relation.ispartofIEEE Transactions on Instrumentation and Measurementen
dc.titleComparative characteristics of thick-film integrated LC filtersen
dc.typeJournal/Magazine Articleen
dc.identifier.doi10.1109/TIM.2002.802238en
dc.identifier.scopus2-s2.0-0036703437en
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/0036703437en
dc.relation.lastpage576en
dc.relation.firstpage570en
dc.relation.issue4en
dc.relation.volume51en
item.grantfulltextnone-
item.fulltextNo Fulltext-
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