Please use this identifier to cite or link to this item:
https://open.uns.ac.rs/handle/123456789/10540
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Damnjanović, Mirjana | en |
dc.contributor.author | Živanov L. | en |
dc.contributor.author | Marić A. | en |
dc.contributor.author | Radosavljević G. | en |
dc.contributor.author | Menićanin A. | en |
dc.contributor.author | Blaž N. | en |
dc.contributor.author | Djurić S. | en |
dc.date.accessioned | 2020-03-03T14:40:09Z | - |
dc.date.available | 2020-03-03T14:40:09Z | - |
dc.date.issued | 2010-12-30 | en |
dc.identifier.isbn | 9781424473946 | en |
dc.identifier.uri | https://open.uns.ac.rs/handle/123456789/10540 | - |
dc.description.abstract | In this paper, characterization of ferrite surface mount bead based on S-parameters measurement, using vector network analyzer E5071B and specially developed PCB test fixture, are presented. The validation of characterization method was performed using commercially available ferrite component, the surface mount 4-way bead. It is shown that proposed approach is efficient in predicting and analyzing the ferrite bead performance, not only in standard frequency range bellow 100 MHz, but also in high frequency range up to 1GHz. ©2010 IEEE. | en |
dc.relation.ispartof | SIISY 2010 - 8th IEEE International Symposium on Intelligent Systems and Informatics | en |
dc.title | Characterization of ferrite surface mount bead using S-parameters | en |
dc.type | Conference Paper | en |
dc.identifier.doi | 10.1109/SISY.2010.5647408 | en |
dc.identifier.scopus | 2-s2.0-78650525833 | en |
dc.identifier.url | https://api.elsevier.com/content/abstract/scopus_id/78650525833 | en |
dc.relation.lastpage | 360 | en |
dc.relation.firstpage | 357 | en |
item.grantfulltext | none | - |
item.fulltext | No Fulltext | - |
crisitem.author.dept | Fakultet tehničkih nauka, Departman za energetiku, elektroniku i telekomunikacije | - |
crisitem.author.parentorg | Fakultet tehničkih nauka | - |
Appears in Collections: | FTN Publikacije/Publications |
SCOPUSTM
Citations
2
checked on Nov 20, 2023
Page view(s)
29
Last Week
11
11
Last month
5
5
checked on May 10, 2024
Google ScholarTM
Check
Altmetric
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.