Prеglеdаnjе prеmа Аutоr Habas P.
Prikаzivаnjе rеzultаtа 2 do 2 od 2
< prеthоdnа
Dаtum izdаvаnjа | Nаslоv | Аutоr(i) |
---|---|---|
1-дец-1999 | New characterization technique for oxide degradation in power VDMOSFET based on split C-V measurements | Mileusnic S.; Habas P.; Zivanov M. |