Prеglеdаnjе prеmа Аutоr Habas P.

Prikаzivаnjе rеzultаtа 1 do 2 od 2
Dаtum izdаvаnjаNаslоvАutоr(i)
1-јан-2001MOS transistors characterization by split C-V methodMileusnic S.; Zivanov M.; Habas P.
1-дец-1999New characterization technique for oxide degradation in power VDMOSFET based on split C-V measurementsMileusnic S.; Habas P.; Zivanov M.