Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/4461
DC FieldValueLanguage
dc.contributor.authorPastor, Kristianen_US
dc.contributor.authorAčanski, Marijanaen_US
dc.contributor.authorVujić, Đuraen_US
dc.contributor.authorJovanović, Đorđeen_US
dc.contributor.authorWienkoop, Stefanieen_US
dc.date.accessioned2019-09-23T10:34:25Z-
dc.date.available2019-09-23T10:34:25Z-
dc.date.issued2016-10-01-
dc.identifier.issn00095893en_US
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/4461-
dc.description.abstract© 2016, Springer-Verlag Berlin Heidelberg. In this work flour samples of various cereal species, a group of different cultivars of small grain species (wheat, Triticum spp.; barley, Hordeum vulgare; oat, Avena sativa; rye, Secale cereale; triticale, Triticosecale) and cultivars of corn species, Zea Mays, growing in the same period and in the same geographical area, were selected to establish differences between each other, using a new rapid method: a comparison of derivatized hexane extracts by GC–MS and multivariate analysis, using the characteristic fragmentation ion m/z 74, without performing qualitative and quantitative analysis of eluting components. Obtained results were compared with the results obtained using a common electron microscopy method. Flour samples made of every corn and oat cultivar showed complete differences compared to flour samples of each wheat, barley, rye and triticale cultivar investigated in this study. The GC–MS approach combined with multivariate analysis outperforms the standard electron microscopy method in a faster and easier way, and may be used to verify flour types in the market.en_US
dc.language.isoenen_US
dc.publisherSpringeren_US
dc.relation.ispartofChromatographiaen_US
dc.titleAuthentication of Cereal Flours by Multivariate Analysis of GC–MS Dataen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.doi10.1007/s10337-016-3142-9-
dc.identifier.scopus2-s2.0-84978870794-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/84978870794-
dc.description.versionPublisheden_US
dc.relation.lastpage1393en_US
dc.relation.firstpage1387en_US
dc.relation.issue19-20en_US
dc.relation.volume79en_US
item.fulltextNo Fulltext-
item.grantfulltextnone-
crisitem.author.deptKatedra za primenjene i inženjerske hemije-
crisitem.author.deptKatedra za primenjene i inženjerske hemije-
crisitem.author.deptDepartman za građevinarstvo i geodeziju-
crisitem.author.orcid0000-0003-0890-8171-
crisitem.author.orcid0000-0003-2673-403X-
crisitem.author.parentorgTehnološki fakultet-
crisitem.author.parentorgTehnološki fakultet-
crisitem.author.parentorgFakultet tehničkih nauka-
Appears in Collections:TF Publikacije/Publications
Show simple item record

SCOPUSTM   
Citations

16
checked on May 3, 2024

Page view(s)

26
Last Week
5
Last month
2
checked on May 10, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.