Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/13872
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dc.contributor.authorDesnica, Vladanen_US
dc.contributor.authorŽivanov, Ljiljanaen_US
dc.contributor.authorAleksić O.en_US
dc.contributor.authorLuković, Miroljuben_US
dc.date.accessioned2020-03-03T14:54:02Z-
dc.date.available2020-03-03T14:54:02Z-
dc.date.issued2002-01-01-
dc.identifier.isbn0780372352en_US
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/13872-
dc.description.abstractThick film technology using well-known concept is presented as a workable approach for integration of passive components. This work states seventeen (17) different symmetrical EMI/RFI (electromagnetic interference/radio frequency interference) filter designs. Attenuation and Smith charts of symmetrical EMI/RFI filters are measured on network analyzer in the range of 1 MHz to 3 GHz. © 2002 IEEE.en
dc.relation.ispartof2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedingsen
dc.titleSymmetrical thick film EMI/RFI filtersen_US
dc.typeConference Paperen_US
dc.identifier.doi10.1109/MIEL.2002.1003211-
dc.identifier.scopus2-s2.0-3142781094-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/3142781094-
dc.description.versionUnknownen_US
dc.relation.lastpage364en
dc.relation.firstpage361en
dc.relation.volume1en
item.fulltextNo Fulltext-
item.grantfulltextnone-
Appears in Collections:Naučne i umetničke publikacije
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