Please use this identifier to cite or link to this item: https://open.uns.ac.rs/handle/123456789/13532
DC FieldValueLanguage
dc.contributor.authorStanković R.en_US
dc.contributor.authorPavlović O.en_US
dc.contributor.authorVojnović M.en_US
dc.contributor.authorJovanović S.en_US
dc.date.accessioned2020-03-03T14:52:43Z-
dc.date.available2020-03-03T14:52:43Z-
dc.date.issued1994-01-01-
dc.identifier.issn00143057en_US
dc.identifier.urihttps://open.uns.ac.rs/handle/123456789/13532-
dc.description.abstractThick polypyrrole (PPy) layers (10-130 μm) were prepared electrochemically on Pt anodes under galvanostatic conditions. The effects of formation parameters (e.g. electrolyte recycling, current density, temperature, solvent, the amount of water in the reaction mixture and film thickness) on the conductivity and morphology of the prepared PPy films were studied. In addition the effects of the nature of the counterion and of the nature and size of the cation associated with the counterion on the conductivity, morphology and electroactivity of the PPy films were examined. It has been shown that the electroactivity of thick PPy films in LiClO4 as electrolyte was rather good if the films were prepared in electrolyte containing large anions such as the tosylate anion. © 1994.en
dc.relation.ispartofEuropean Polymer Journalen
dc.titleThe effects of preparation conditions on the properties of electrochemically synthesized thick films of polypyrroleen_US
dc.typeJournal/Magazine Articleen_US
dc.identifier.doi10.1016/0014-3057(94)90303-4-
dc.identifier.scopus2-s2.0-0028400794-
dc.identifier.urlhttps://api.elsevier.com/content/abstract/scopus_id/0028400794-
dc.description.versionUnknownen_US
dc.relation.lastpage393en
dc.relation.firstpage385en
dc.relation.issue3en
dc.relation.volume30en
item.grantfulltextnone-
item.fulltextNo Fulltext-
Appears in Collections:Naučne i umetničke publikacije
Show simple item record

SCOPUSTM   
Citations

62
checked on May 10, 2024

Page view(s)

7
Last Week
6
Last month
0
checked on May 3, 2024

Google ScholarTM

Check

Altmetric


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.